Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

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dc.contributor.authorHASAR UĞUR CEM
dc.contributor.authorKAYA YUNUS
dc.contributor.authorÖZTÜRK HAMDULLAH
dc.contributor.authorİZGINLI MÜCAHİT
dc.contributor.authorBARROSO JOAQUIM JOSE
dc.contributor.authorRAMAHI OMAR MUSTAFA
dc.contributor.authorERTUĞRUL MEHMET
dc.contributor.authorİzgınlı, Mücahit
dc.date.accessioned2026-06-12T11:51:50Z
dc.date.issued2022
dc.descriptionSCI-Expanded | Q:Q1 | YÖK-Özgeçmiş
dc.identifier.doi10.1109/TGRS.2021.3090712
dc.identifier.issn0196-2892
dc.identifier.urihttps://hdl.handle.net/20.500.11782/6769
dc.relation.ispartofIEEE Transactions on Geoscience and Remote Sensing
dc.titleComplex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
dspace.entity.typePublication
relation.isAuthorOfPublication10b66824-de62-4587-a673-aca2d0642e67
relation.isAuthorOfPublication.latestForDiscovery10b66824-de62-4587-a673-aca2d0642e67

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