Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
| dc.contributor.author | Hasar, Ugur Cem | |
| dc.contributor.author | Kaya, Yunus | |
| dc.contributor.author | Ozturk, Hamdullah | |
| dc.contributor.author | Izginli, Mucahit | |
| dc.contributor.author | Ertugrul, Mehmet | |
| dc.contributor.author | Barroso, Joaquim Jose | |
| dc.contributor.author | Ramahi, Omar M. | |
| dc.date.accessioned | 2022-08-11T06:38:21Z | |
| dc.date.available | 2022-08-11T06:38:21Z | |
| dc.date.issued | 2022 | en_US |
| dc.department | HKÜ, Mühendislik Fakültesi, Elektrik Elektronik Mühendisliği Bölümü | en_US |
| dc.description.abstract | A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature. | en_US |
| dc.identifier.citation | Hasar, U. C., Kaya, Y., Ozturk, H., Izginli, M., Ertugrul, M., Barroso, J. J., & Ramahi, O. M. (January 01, 2022). Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements. Ieee Transactions on Instrumentation and Measurement, 71, 1-8. | en_US |
| dc.identifier.doi | 10.1109/TIM.2022.3153991 | |
| dc.identifier.issn | 0018-9456 | |
| dc.identifier.issn | 1557-9662 | |
| dc.identifier.orcid | 0000-0001-8468-1568 | en_US |
| dc.identifier.scopus | 2-s2.0-85125330581 | |
| dc.identifier.scopusquality | Q1 | |
| dc.identifier.uri | https://doi.org/10.1109/TIM.2022.3153991 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.11782/2640 | |
| dc.identifier.volume | 71 | en_US |
| dc.identifier.wos | WOS:000770592900011 | |
| dc.identifier.wosquality | Q1 | |
| dc.indekslendigikaynak | Web of Science | |
| dc.indekslendigikaynak | Scopus | |
| dc.language.iso | en | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
| dc.relation.ispartof | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | uncalibrated measurements | en_US |
| dc.subject | gating | en_US |
| dc.subject | free-space | en_US |
| dc.subject | deembedding technique | en_US |
| dc.subject | Complex permittivity | en_US |
| dc.title | Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements | |
| dc.type | Article |
