Predicting patent quality based on machine learning approach

dc.contributor.authorErdogan, Zulfiye
dc.contributor.authorAltuntas, Serkan
dc.contributor.authorDereli, Turkay
dc.date.accessioned2023-10-11T12:33:33Z
dc.date.available2023-10-11T12:33:33Z
dc.date.issuedSEP 2022en_US
dc.departmentHKÜ, Mühendislik Fakültesi, Makine Mühendisliği Bölümüen_US
dc.description.abstractThe investment budget allocated by companies in R&D activities has increased due to increased competition in the market. Applications for industrial property rights by countries, investors, companies, and universities to protect inventions obtained as an outcome of investments have also increased. The selection of the patent to be invested becomes more difficult with the increasing number of applications. Therefore, predicting patent quality is quite significant for companies to be successful in the future. The level to which a patent meets the expectations of decision makers is referred to as patent quality. Patent indices represent decision makers' expectations. In this study, an approach is proposed to predict patent quality in practice. The proposed approach uses supervised learning algorithms and analytic hierarchy process (AHP) method. The proposed approach is applied to patents related to personal digital assistant technologies. The performances of individual and ensemble machine learning methods have been also analyzed to establish the prediction model. In addition, 75% split ratio and the five-fold cross-validation methods have been used to verify the prediction model. The multilayer perceptron algorithm has 76% accuracy value. The proposed prediction model is essential in directing R&D studies to the right technology areas and transferring the incentives to patent applications with a high quality rate.en_US
dc.identifier.citationErdogan, Z, Altuntas, S, & Dereli, T. (SEP 2022). Predicting patent quality based on machine learning approach.Ieee Transactıons On Engıneerıng Management. https://doi.org/10.1109/TEM.2022.3207376.en_US
dc.identifier.doi10.1109/TEM.2022.3207376
dc.identifier.issn0018-9391
dc.identifier.issn1558-0040
dc.identifier.orcid0000-0002-2130-5503en_US
dc.identifier.scopus2-s2.0-85182398139
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1109/TEM.2022.3207376
dc.identifier.urihttps://hdl.handle.net/20.500.11782/3869
dc.identifier.wosWOS:000862350800001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherIeee-Inst Electrıcal Electronıcs Engıneers Incen_US
dc.relation.ispartofIeee Transactıons On Engıneerıng Management
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/restrictedAccessen_US
dc.subjectPatentsen_US
dc.subjectCodesen_US
dc.subjectClustering algorithmsen_US
dc.subjectPrediction algorithmsen_US
dc.subjectMachine learning algorithmsen_US
dc.subjectPredictive modelsen_US
dc.subjectTechnological innovationen_US
dc.subjectAnalytic hierarchy process (AHP)en_US
dc.subjectmachine learningen_US
dc.subjectmultilayer perceptronen_US
dc.subjectpatent indicesen_US
dc.subjectsupervised learning algorithmsen_US
dc.titlePredicting patent quality based on machine learning approach
dc.typeArticle

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