End-to-End Industrial Defect Detection: A Comparative Analysis of DETR and YOLOv8 Architectures on Printed Circuit Boards
| dc.contributor.author | Haznedar, Hilal | |
| dc.contributor.author | Yıldırım Alperen | |
| dc.date.accessioned | 2026-10-15T04:15:09Z | |
| dc.date.issued | 2026 | |
| dc.description | Uluslararası | Tam metin bildiri | YÖK-Özgeçmiş | |
| dc.identifier.uri | https://hdl.handle.net/20.500.11782/12049 | |
| dc.relation.ispartof | UBMK 2026 | |
| dc.title | End-to-End Industrial Defect Detection: A Comparative Analysis of DETR and YOLOv8 Architectures on Printed Circuit Boards | |
| dc.type | Conference Object | |
| dspace.entity.type | Publication | |
| hku.portal.eserid | t:bildiri:7b933594f05948ef | |
| hku.yoksis.yayinid | 10501415 | |
| relation.isAuthorOfPublication | 11e27e8a-91f7-4030-95a2-081f632d7c1f | |
| relation.isAuthorOfPublication.latestForDiscovery | 11e27e8a-91f7-4030-95a2-081f632d7c1f |