Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
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Yayıncı
Institute of Electrical and Electronics Engineers Inc.
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method. IEEE
Açıklama
Anahtar Kelimeler
Complex permeability, complex permittivity, Dielectric loss measurement, Electromagnetic waveguides, Frequency measurement, known substrate
Kaynak
IEEE Microwave and Wireless Components Letters
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Künye
Hasar, U. C., Ozturk, H., Kaya, Y., Izginli, M., & Ertugrul, M. (January 01, 2021). Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements. Ieee Microwave and Wireless Components Letters, 1-4.
