Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
| dc.contributor.author | Hasar, Ugur Cem | |
| dc.contributor.author | Ozturk, Hamdullah | |
| dc.contributor.author | Izginli, Mucahit | |
| dc.contributor.author | Ertuǧrul, M. | |
| dc.date.accessioned | 2021-03-18T05:19:13Z | |
| dc.date.available | 2021-03-18T05:19:13Z | |
| dc.date.issued | 2021 | en_US |
| dc.department | HKÜ, Mühendislik Fakültesi, Elektrik Elektronik Mühendisliği Bölümü | en_US |
| dc.description.abstract | A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method. IEEE | en_US |
| dc.identifier.citation | Hasar, U. C., Ozturk, H., Kaya, Y., Izginli, M., & Ertugrul, M. (January 01, 2021). Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements. Ieee Microwave and Wireless Components Letters, 1-4. | en_US |
| dc.identifier.doi | 10.1109/LMWC.2020.3046697 | |
| dc.identifier.issn | 15311309 | |
| dc.identifier.orcid | 0000-0001-8468-1568 | en_US |
| dc.identifier.scopus | 2-s2.0-85099534466 | |
| dc.identifier.scopusquality | N/A | |
| dc.identifier.uri | https://doi.org/10.1109/LMWC.2020.3046697 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.11782/2309 | |
| dc.identifier.wos | WOS:000629021700024 | |
| dc.identifier.wosquality | Q2 | |
| dc.indekslendigikaynak | Web of Science | |
| dc.indekslendigikaynak | Scopus | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
| dc.relation.ispartof | IEEE Microwave and Wireless Components Letters | |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Complex permeability | en_US |
| dc.subject | complex permittivity | en_US |
| dc.subject | Dielectric loss measurement | en_US |
| dc.subject | Electromagnetic waveguides | en_US |
| dc.subject | Frequency measurement | en_US |
| dc.subject | known substrate | en_US |
| dc.title | Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements | |
| dc.type | Article |
